MURILLO MARTÍNEZ, Cristian Alexis; AGUDELO, William Mauricio. Sensitivity analysis of the backprojection imaging method for seismic event location. CT&F - Ciencia, Tecnología y Futuro, [S. l.], v. 11, n. 1, p. 21–32, 2021. DOI: 10.29047/01225383.167. Disponível em: https://ctyf.journal.ecopetrol.com.co/index.php/ctyf/article/view/167. Acesso em: 25 apr. 2024.